Universal Measurement Spectrophotometer (UMS) – Agilent Technologies Cary 7000 UV-VIS-NIR

• Measurement modes:
  • Abs mode – display data in absorbance units, up to 10 Abs range
  • %T mode – display the photometric value in percent transmission mode, direct transmission (180°) and variable angle transmission from 0° to 180° in 0.02° intervals
  • %R mode – display the photometric value in percent reflectance mode, used in Diffuse Reflectance on rough sample surface, independent sample rotation (360°) and detector positioning (10°–350°) at 0.02° internals
  • Absolute %R mode – display the collected data as the square root of the %R value, used in Specular Reflectance on a smooth sample surface, variable angle from 5° to 85° in 0.02° intervals
• 2 Monochromators: double out-of-plane Littrow monochromator
• 2 Gratings: 70 x 45 mm
  • UV-Vis: Ruled line diffraction grating, 1200 l/mm blazed at 250 nm
  • NIR: Ruled line diffraction grating, 300 l/mm blazed at 1192 nm
• 3 Detectors:
  • On Cary 5000 unit: R928 PMT (UV-Vis), Cooled PbSmart PbS (NIR)
  • On UMA unit: two-colored Si/InGaAs detector (UV-Vis and NIR)
• 2 Light sources:
  • Deuterium lamp: 190 – 350 nm
  • Halogen lamp: 350 – 3300 nm
  • * A third light source of mercury lamp is also installed but only used for Performance Test during maintenance
• Beam splitting system: Rotating beam splitter, measure a sample, dark and reference signal per cycle with a speed of 30 Hz
• Auto-polarizer: p and s polarization 
• Cary 5000 unit wavelength range (nm):
  • 175 nm – 3300 nm
  • N₂ purge required below 185 nm
• UMA unit wavelength range (nm):
  • Without auto-polarizer: 190 – 2800 nm
  • With auto-polarizer: 250 – 2500 nm
• Wavelength changeovers:
  • Light source changeover: 320 nm
  • Detector changeover: 1050 nm
  • Grating changeover: 720 nm 
• Limiting resolution (nm):
  • UV-Vis: <0.048 nm
  • NIR: <0.2 nm
• Spectral bandwidth SBW (nm): 2 nm recommended
  • UV-Vis: 0.01 – 5.00 nm, 0.01 nm steps
  • NIR: 0.04 – 20 nm
• Signal averaging time (sec): 0.033 – 999 sec
• Maximum scan rate (nm/min)
  • UV-Vis: 2000 nm/min
  • NIR: 8000 nm/min
• Slew rate (wavelength changeover speed, nm/min)
  • UV-Vis: 16000 nm/min
  • NIR: 64000 nm/min
• Data interval:
  • UV-Vis: 0.005 – 1.111 nm, 1.627 – 17.335 cm^-1, 0.05 – 11.1 Å
  • NIR: 0.02 – 4.444 nm, 0.3145 – 4.0753 cm^-1, 0.2 – 44.44 Å
  • * Interval range is dependent upon scan range
• Repetitive scanning:
  • Maximum number of cycles: 999
  • Maximum cycle time (min): 9999
• Baseline correction
• Sample size:
  • 5 mm minimum to 275 mm maximum
  • 255 mm if detector slide mount is installed
  • 235 mm if a depolarizer is mounted in detector slide mount
  • Maximum physical thickness: 30 mm using standard supplied sample holder
• UMA unit aperture masks: 1, 2 and 3 degrees (H and V) for incident beam

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