Microscopy
Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst ®
The Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst® for scanning probe microscopy is capable of nanoscale surface topography and morphology measurements of a range of different surface types producing high resolution, three-dimensional images by scanning a sharp probe over the sample surface.
Features
- NanoScope® Scanning Probe Microscope (SPM) control station
- NanoScope® analysis software
- Display and capture up to eight images simultaneously
- Integrated acoustic and vibration isolation enclosure
- 210mm vacuum sample chuck
- Regular contact mode and tapping mode with f0 = 300 kHz
- Peak Force QNM software maps nano-mechanical properties while simultaneously imaging sample topography at high resolution
- Probe tip resolution ~ 5 nm
- New AFM probes for sale
Location
Materials Characterization Laboratory
Furnas Hall room #109/110
University at Buffalo North Campus
Buffalo, NY 14260
Fees
Category D Rates
- Internal Academic: $25 per hour
- External Academic: $45 per hour
- Industry: $100 per hour
Bruker Dimension Icon Atomic Force Microscope with ScanAsyst
For general inquiries, contact:
Donald J. Goralski
Director, Shared Instrumentation Laboratories
(716) 645-5151
For technical inquiries, contact:
Zongmin (Shirley) Bei, PhD
Senior Research Support Specialist
Shared Instrumentation Laboratories (716) 645-5165